Design of a Low-Voltage CMOS Charge Pump

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4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008)

January 23-January 25

ISBN: 978-0-7695-3110-6

	ASCII Text	x
	Chun Yu Cheng, Ka Nang Leung, Yi Ki Sun, Pui Ying Or, "Design of a Low-Voltage CMOS Charge Pump," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 342-345, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008.

	BibTex	x
	@article{ 10.1109/DELTA.2008.48, author = {Chun Yu Cheng and Ka Nang Leung and Yi Ki Sun and Pui Ying Or}, title = {Design of a Low-Voltage CMOS Charge Pump}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3110-6}, pages = {342-345}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.48}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Design of a Low-Voltage CMOS Charge Pump SN - 978-0-7695-3110-6 SP342 EP345 A1 - Chun Yu Cheng, A1 - Ka Nang Leung, A1 - Yi Ki Sun, A1 - Pui Ying Or, PY - 2008 KW - Charge pump KW - efficiency VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.48

A charge pump based on the cross-coupled structure generates a 2? VDD output. The circuit delivering 10 mA@VDD = 0.9 V from a single NiMH battery is designed in a commercial 0.35 ?m CMOS process. The design operates at a supply voltage as low as VDD = 0.9 V with efficiency of better than 80% and the maximum VDD is 1.4 V. The implementation method of the cross-coupled charge pump is summarized in this paper.

Index Terms:

Charge pump, efficiency

Citation:

Chun Yu Cheng, Ka Nang Leung, Yi Ki Sun, Pui Ying Or, "Design of a Low-Voltage CMOS Charge Pump," delta, pp.342-345, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008

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