4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) Adaptive Diagnostic Pattern Generation for Scan Chains January 23-January 25 ISBN: 978-0-7695-3110-6
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.45
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, a SAT-based technique is proposed to adaptively generate patterns to diagnose stuck-at faults in scan chains. Experimental results on ISCAS'89 benchmark circuits show that the proposed method can dramatically reduce the number of diagnostic patterns while obtain high diagnosis resolution.
Index Terms:
scan chain, diagnosis, testing, Boolean satisfiability, very large scale integration (VLSI)
Citation:
Fei Wang, Yu Hu, Xiaowei Li, "Adaptive Diagnostic Pattern Generation for Scan Chains," delta, pp.129-132, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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