Built-In Self-Test for Embedded Voltage Regulator

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4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008)

January 23-January 25

ISBN: 978-0-7695-3110-6

	ASCII Text	x
	Jiang Shi, Ricky Smith, "Built-In Self-Test for Embedded Voltage Regulator," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 133-136, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008.

	BibTex	x
	@article{ 10.1109/DELTA.2008.41, author = {Jiang Shi and Ricky Smith}, title = {Built-In Self-Test for Embedded Voltage Regulator}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3110-6}, pages = {133-136}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.41}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Built-In Self-Test for Embedded Voltage Regulator SN - 978-0-7695-3110-6 SP133 EP136 A1 - Jiang Shi, A1 - Ricky Smith, PY - 2008 KW - embedded KW - regulator KW - voltage output KW - manufacturing KW - current loading KW - built-in KW - self-test VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Jiang Shi

Ricky Smith

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.41

The embedded voltage regulator design supports the single-chip CMOS integration market strategy to reduce the overall system cost and improve system performance. Multiply technologies, such as innovative built-in self-test technology and accurate test methodology for embedded voltage regulator are presented that is critical for test accessibility and reliability.

Index Terms:

embedded, regulator, voltage output, manufacturing, current loading, built-in, self-test

Citation:

Jiang Shi, Ricky Smith, "Built-In Self-Test for Embedded Voltage Regulator," delta, pp.133-136, 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008

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