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Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)
Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique
Kuala Lumpur, Malaysia
January 17-January 19
ISBN: 0-7695-2500-8
ASCII Text
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Syed Zahidul Islam, Mohd. Alauddin Mohd. Ali, "Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 105-112, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006.
 
 
BibTex
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@article{ 10.1109/DELTA.2006.86,
author = {Syed Zahidul Islam and Mohd. Alauddin Mohd. Ali},
title = {Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique},
journal ={Electronic Design, Test and Applications, IEEE International Workshop on},
volume = {0},
year = {2006},
isbn = {0-7695-2500-8},
pages = {105-112},
doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.86},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Electronic Design, Test and Applications, IEEE International Workshop on
TI - Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique
SN - 0-7695-2500-8
SP105
EP112
A1 - Syed Zahidul Islam,
A1 - Mohd. Alauddin Mohd. Ali,
PY - 2006
KW - null
VL - 0
JA - Electronic Design, Test and Applications, IEEE International Workshop on
ER -
 
Syed Zahidul Islam, Swinburne University of Technology, Sarawak, Malaysia
Mohd. Alauddin Mohd. Ali, Universiti Kebangsaan Malaysia (UKM), Malaysia
This paper presents a test pattern optimization approach using a proper number of seed selection in mixed-mode patterns. In mixed-mode patterns, the test set is assembled from LFSR based pseudorandom and deterministic patterns. The efficiency of this approach is largely determined by the ratio of those test patterns in the final test. The experiment results show that the total number of patterns in this optimized mixed-mode is minimized compared to conventional mixed-mode technique.
Citation:
Syed Zahidul Islam, Mohd. Alauddin Mohd. Ali, "Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique," delta, pp.105-112, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006
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