Some Common Aspects of Design Validation,Debug and Diagnosis

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	Similar Articles Articles by Talal Arnaout Articles by Gunter Bartsch Articles by Hans-Joachim Wunderlich

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)

Kuala Lumpur, Malaysia

January 17-January 19

ISBN: 0-7695-2500-8

	ASCII Text	x
	Talal Arnaout, Gunter Bartsch, Hans-Joachim Wunderlich, "Some Common Aspects of Design Validation,Debug and Diagnosis," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 3-10, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006.

	BibTex	x
	@article{ 10.1109/DELTA.2006.79, author = {Talal Arnaout and Gunter Bartsch and Hans-Joachim Wunderlich}, title = {Some Common Aspects of Design Validation,Debug and Diagnosis}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2006}, isbn = {0-7695-2500-8}, pages = {3-10}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.79}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Some Common Aspects of Design Validation,Debug and Diagnosis SN - 0-7695-2500-8 SP3 EP10 A1 - Talal Arnaout, A1 - Gunter Bartsch, A1 - Hans-Joachim Wunderlich, PY - 2006 KW - null VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Talal Arnaout, Universitat Stuttgart, Germany

Gunter Bartsch, Universitat Stuttgart, Germany

Hans-Joachim Wunderlich, Universitat Stuttgart, Germany

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.79

Design, Verification and Test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnostic resolution. In this paper, an overview is given on the common aspects of these tasks and how they interact. Diagnosis techniques may be used after manufacturing, for chip characterization and field return analysis, and even for rapid prototyping.

Citation:

Talal Arnaout, Gunter Bartsch, Hans-Joachim Wunderlich, "Some Common Aspects of Design Validation,Debug and Diagnosis," delta, pp.3-10, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006

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