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Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)
Lossless Active Floating Inductance Simulator
Kuala Lumpur, Malaysia
January 17-January 19
ISBN: 0-7695-2500-8
ASCII Text
x 
 
Shahram Minaei, Erkan Yuce, Oguzhan Cicekoglu, "Lossless Active Floating Inductance Simulator," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 332-335, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006.
 
 
BibTex
x
 
@article{ 10.1109/DELTA.2006.61,
author = {Shahram Minaei and Erkan Yuce and Oguzhan Cicekoglu},
title = {Lossless Active Floating Inductance Simulator},
journal ={Electronic Design, Test and Applications, IEEE International Workshop on},
volume = {0},
year = {2006},
isbn = {0-7695-2500-8},
pages = {332-335},
doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.61},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Electronic Design, Test and Applications, IEEE International Workshop on
TI - Lossless Active Floating Inductance Simulator
SN - 0-7695-2500-8
SP332
EP335
A1 - Shahram Minaei,
A1 - Erkan Yuce,
A1 - Oguzhan Cicekoglu,
PY - 2006
KW - null
VL - 0
JA - Electronic Design, Test and Applications, IEEE International Workshop on
ER -
 
Shahram Minaei, Dogus University, Turkey
Erkan Yuce, Bogazici University, Turkey
Oguzhan Cicekoglu, Bogazici University, Turkey
In this paper, a new active circuit for realizing lossless floating inductor using current controlled conveyors (CCCIIs) and single capacitor is presented. The proposed inductance simulator can be tuned electronically by changing the biasing currents of the CCCIIs. As an application, the proposed floating inductance simulator is used to construct a fifth-order low-pass filter. The theoretical analysis is verified by SPICE simulation results.
Citation:
Shahram Minaei, Erkan Yuce, Oguzhan Cicekoglu, "Lossless Active Floating Inductance Simulator," delta, pp.332-335, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006
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