loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)
Innovation In Test: Where Are We
Kuala Lumpur, Malaysia
January 17-January 19
ISBN: 0-7695-2500-8
ASCII Text
x 
 
Rochit Rajsuman, "Innovation In Test: Where Are We," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 289-294, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006.
 
 
BibTex
x
 
@article{ 10.1109/DELTA.2006.59,
author = {Rochit Rajsuman},
title = {Innovation In Test: Where Are We},
journal ={Electronic Design, Test and Applications, IEEE International Workshop on},
volume = {0},
year = {2006},
isbn = {0-7695-2500-8},
pages = {289-294},
doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.59},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Electronic Design, Test and Applications, IEEE International Workshop on
TI - Innovation In Test: Where Are We
SN - 0-7695-2500-8
SP289
EP294
A1 - Rochit Rajsuman,
PY - 2006
KW - null
VL - 0
JA - Electronic Design, Test and Applications, IEEE International Workshop on
ER -
 
Rochit Rajsuman, Advantest America Corporation, Santa Clara, CA
In this paper, key recent innovations with respect to all major segments of the test industry are discussed. These innovations do not provide incremental improvement; they change the paradigm impacting the productivity and cost by orders of magnitude. The objective is to provide guidance for academic and industrial researchers for these new grounds.
Citation:
Rochit Rajsuman, "Innovation In Test: Where Are We," delta, pp.289-294, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006
Usage of this product signifies your acceptance of the Terms of Use.