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Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)
Current Testable Design of Resistor String DACs
Kuala Lumpur, Malaysia
January 17-January 19
ISBN: 0-7695-2500-8
ASCII Text
x 
 
Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura, "Current Testable Design of Resistor String DACs," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 197-200, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006.
 
 
BibTex
x
 
@article{ 10.1109/DELTA.2006.28,
author = {Masaki Hashizume and Tomomi Nishida and Hiroyuki Yotsuyanagi and Takeomi Tamesada and Yukiya Miura},
title = {Current Testable Design of Resistor String DACs},
journal ={Electronic Design, Test and Applications, IEEE International Workshop on},
volume = {0},
year = {2006},
isbn = {0-7695-2500-8},
pages = {197-200},
doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.28},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Electronic Design, Test and Applications, IEEE International Workshop on
TI - Current Testable Design of Resistor String DACs
SN - 0-7695-2500-8
SP197
EP200
A1 - Masaki Hashizume,
A1 - Tomomi Nishida,
A1 - Hiroyuki Yotsuyanagi,
A1 - Takeomi Tamesada,
A1 - Yukiya Miura,
PY - 2006
KW - null
VL - 0
JA - Electronic Design, Test and Applications, IEEE International Workshop on
ER -
 
Masaki Hashizume, Univ. of Tokushima, Japan
Tomomi Nishida, Univ. of Tokushima, Japan
Hiroyuki Yotsuyanagi, Univ. of Tokushima, Japan
Takeomi Tamesada, Univ. of Tokushima, Japan
Yukiya Miura, Tokyo Metropolitan Univ.
In this paper, supply current testability is examined experimentally for opens and shorts in a general 3 bit resistor string Digital/Analog converter(DAC). The results show that all of the shorts and the opens are detected by supply current testing, while opens of the MOS switches are not detected. A DFT method for resistor string DACs is proposed in this paper to detect the opens by supply current testing. Also, testability of a resistor string DAC designed with the DFT method is examined. It is shown that all of the targeted shorts and opens in the testable designed DAC are detected by supply current testing.
Citation:
Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura, "Current Testable Design of Resistor String DACs," delta, pp.197-200, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006
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