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Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)
Catastrophic and Parametric Fault Modelling for Photonic Systems
Kuala Lumpur, Malaysia
January 17-January 19
ISBN: 0-7695-2500-8
Muhsen Aljada, Edith Cowan University, Australia
Adam Osseiran, Edith Cowan University, Australia
Kamal Alameh, Edith Cowan University, Australia
In this paper we investigate the impact of the most common catastrophic and parametric faults in photonic systems. We demonstrate, using the example of a photonic correlator, the effectiveness of testing techniques for fault detection in photonic systems. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for photonic systems.
Index Terms:
photonic, fault modelling, fault simulation, photonic testing, catastrophic faults, parametric faults.
Citation:
Muhsen Aljada, Adam Osseiran, Kamal Alameh, "Catastrophic and Parametric Fault Modelling for Photonic Systems," delta, pp.190-196, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006
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