Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) Catastrophic and Parametric Fault Modelling for Photonic Systems Kuala Lumpur, Malaysia January 17-January 19 ISBN: 0-7695-2500-8
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.21
In this paper we investigate the impact of the most common catastrophic and parametric faults in photonic systems. We demonstrate, using the example of a photonic correlator, the effectiveness of testing techniques for fault detection in photonic systems. To the best of our knowledge, this constitutes the first attempt to define a fault model and to develop a test methodology for photonic systems.
Index Terms:
photonic, fault modelling, fault simulation, photonic testing, catastrophic faults, parametric faults.
Citation:
Muhsen Aljada, Adam Osseiran, Kamal Alameh, "Catastrophic and Parametric Fault Modelling for Photonic Systems," delta, pp.190-196, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||