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Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)
Automatic March Tests Generation for Multi-Port SRAMs
Kuala Lumpur, Malaysia
January 17-January 19
ISBN: 0-7695-2500-8
ASCII Text
x 
 
A. Benso, A. Bosio, S. Di Carlo, G. Di Natale, P. Prinetto, "Automatic March Tests Generation for Multi-Port SRAMs," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 385-392, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006.
 
 
BibTex
x
 
@article{ 10.1109/DELTA.2006.17,
author = {A. Benso and A. Bosio and S. Di Carlo and G. Di Natale and P. Prinetto},
title = {Automatic March Tests Generation for Multi-Port SRAMs},
journal ={Electronic Design, Test and Applications, IEEE International Workshop on},
volume = {0},
year = {2006},
isbn = {0-7695-2500-8},
pages = {385-392},
doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.17},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Electronic Design, Test and Applications, IEEE International Workshop on
TI - Automatic March Tests Generation for Multi-Port SRAMs
SN - 0-7695-2500-8
SP385
EP392
A1 - A. Benso,
A1 - A. Bosio,
A1 - S. Di Carlo,
A1 - G. Di Natale,
A1 - P. Prinetto,
PY - 2006
KW - null
VL - 0
JA - Electronic Design, Test and Applications, IEEE International Workshop on
ER -
 
A. Benso, Dipartimento di Automatica e Informatica Torino, Italy
A. Bosio, Dipartimento di Automatica e Informatica Torino, Italy
S. Di Carlo, Dipartimento di Automatica e Informatica Torino, Italy
G. Di Natale, Dipartimento di Automatica e Informatica Torino, Italy
P. Prinetto, Dipartimento di Automatica e Informatica Torino, Italy
Testing of Multi-Port (MP) SRAMs requires special tests since the multiple and simultaneous access can sensitize faults that are different from the conventional single-port memory faults. In spite of their growing use, few works have been published on testing MP memories. In addition, most of the published work concentrated only on two ports memories (i.e., 2P memories). This paper presents a methodology to automatically generate march tests for MP memories. It is based on generations of single port memory march test firstly, then extending it to test a generic MP SRAMs. A set of experimental results shows the effectiveness of the proposed solution.
Citation:
A. Benso, A. Bosio, S. Di Carlo, G. Di Natale, P. Prinetto, "Automatic March Tests Generation for Multi-Port SRAMs," delta, pp.385-392, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006
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