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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
Testable Design and Testing of High-Speed Superconductor Microelectronics
Christchurch, New Zealand
January 29-January 31
ISBN: 0-7695-1453-7
ASCII Text
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Hans G. Kerkhoff, Arun A. Joseph, Sander Heuvelmans, "Testable Design and Testing of High-Speed Superconductor Microelectronics," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 8, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002.
 
 
BibTex
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@article{ 10.1109/DELTA.2002.994580,
author = {Hans G. Kerkhoff and Arun A. Joseph and Sander Heuvelmans},
title = {Testable Design and Testing of High-Speed Superconductor Microelectronics},
journal ={Electronic Design, Test and Applications, IEEE International Workshop on},
volume = {0},
year = {2002},
isbn = {0-7695-1453-7},
pages = {8},
doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994580},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Electronic Design, Test and Applications, IEEE International Workshop on
TI - Testable Design and Testing of High-Speed Superconductor Microelectronics
SN - 0-7695-1453-7
SP
EP
A1 - Hans G. Kerkhoff,
A1 - Arun A. Joseph,
A1 - Sander Heuvelmans,
PY - 2002
VL - 0
JA - Electronic Design, Test and Applications, IEEE International Workshop on
ER -
 
Hans G. Kerkhoff, MESA+ Research Institute
Arun A. Joseph, MESA+ Research Institute
Sander Heuvelmans, MESA+ Research Institute
True software-defined radio cellular base stations require extremely fast data converters, which can currently not be implemented in semiconductor technology. Superconductor Niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as still very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and it is illustrated how BIST can be a solution of detecting these defects in ADCs under extreme conditions.
Citation:
Hans G. Kerkhoff, Arun A. Joseph, Sander Heuvelmans, "Testable Design and Testing of High-Speed Superconductor Microelectronics," delta, pp.8, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
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