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Design, Automation and Test in Europe (DATE'05) Volume 3
picoArray Technology: The Tool's Story
Munich, Germany
March 07-March 11
ISBN: 0-7695-2288-2
ASCII Text
x 
 
Andrew Duller, Daniel Towner, Gajinder Panesar, Alan Gray, Will Robbins, "picoArray Technology: The Tool's Story," Design, Automation and Test in Europe Conference and Exhibition, vol. 3, pp. 106-111, Design, Automation and Test in Europe (DATE'05) Volume 3, 2005.
 
 
BibTex
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@article{ 10.1109/DATE.2005.239,
author = {Andrew Duller and Daniel Towner and Gajinder Panesar and Alan Gray and Will Robbins},
title = {picoArray Technology: The Tool's Story},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {3},
year = {2005},
issn = {1530-1591},
pages = {106-111},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.239},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - picoArray Technology: The Tool's Story
SN - 1530-1591
SP106
EP111
A1 - Andrew Duller,
A1 - Daniel Towner,
A1 - Gajinder Panesar,
A1 - Alan Gray,
A1 - Will Robbins,
PY - 2005
KW - null
VL - 3
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Andrew Duller, picoChip Designs Ltd., UK
Daniel Towner, picoChip Designs Ltd., UK
Gajinder Panesar, picoChip Designs Ltd., UK
Alan Gray, picoChip Designs Ltd., UK
Will Robbins, picoChip Designs Ltd., UK
This paper briefly describes the picoArray™ architecture, and in particular the deterministic internal communication fabric. The methods that have been developed for debugging and verifying systems using devices from the picoArray family are explained. In order to maximize the computational ability of these devices, hardware debugging support has been kept to a minimum and the methods and tools developed to take this into account.
Citation:
Andrew Duller, Daniel Towner, Gajinder Panesar, Alan Gray, Will Robbins, "picoArray Technology: The Tool's Story," date, vol. 3, pp.106-111, Design, Automation and Test in Europe (DATE'05) Volume 3, 2005
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