Noise Figure Evaluation Using Low Cost BIST

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Design, Automation and Test in Europe (DATE'05) Volume 1

Munich, Germany

March 07-March 11

ISBN: 0-7695-2288-2

	ASCII Text	x
	Marcelo Negreiros, Luigi Carro, Altamiro A. Susin, "Noise Figure Evaluation Using Low Cost BIST," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 158-163, Design, Automation and Test in Europe (DATE'05) Volume 1, 2005.

	BibTex	x
	@article{ 10.1109/DATE.2005.224, author = {Marcelo Negreiros and Luigi Carro and Altamiro A. Susin}, title = {Noise Figure Evaluation Using Low Cost BIST}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {1}, year = {2005}, issn = {1530-1591}, pages = {158-163}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.224}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Noise Figure Evaluation Using Low Cost BIST SN - 1530-1591 SP158 EP163 A1 - Marcelo Negreiros, A1 - Luigi Carro, A1 - Altamiro A. Susin, PY - 2005 KW - null VL - 1 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

Marcelo Negreiros, Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, RS, Brazil

Luigi Carro, Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, RS, Brazil

Altamiro A. Susin, Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, RS, Brazil

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2005.224

A technique for evaluating noise figure suitable for BIST implementation is described. It is based on a low cost single-bit digitizer, which allows the simultaneous evaluation of noise figure in several test points of the analog circuit. The method is also able to benefit from SoC resources, like memory and processing power. Theoretical background and experimental results are presented in order to demonstrate the feasibility of the approach.

Citation:

Marcelo Negreiros, Luigi Carro, Altamiro A. Susin, "Noise Figure Evaluation Using Low Cost BIST," date, vol. 1, pp.158-163, Design, Automation and Test in Europe (DATE'05) Volume 1, 2005

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