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Design, Automation and Test in Europe (DATE'05) Volume 2
Munich, Germany
March 07-March 11
ISBN: 0-7695-2288-2
ASCII Text
x 
 
Domenico Barretta, William Fornaciari, Mariagiovanna Sami, Daniele Bagni, "Multithreaded Extension to Multicluster VLIW Processors for Embedded Applications," Design, Automation and Test in Europe Conference and Exhibition, vol. 2, pp. 748-749, Design, Automation and Test in Europe (DATE'05) Volume 2, 2005.
 
 
BibTex
x
 
@article{ 10.1109/DATE.2005.219,
author = {Domenico Barretta and William Fornaciari and Mariagiovanna Sami and Daniele Bagni},
title = {Multithreaded Extension to Multicluster VLIW Processors for Embedded Applications},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {2},
year = {2005},
issn = {1530-1591},
pages = {748-749},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.219},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Multithreaded Extension to Multicluster VLIW Processors for Embedded Applications
SN - 1530-1591
SP748
EP749
A1 - Domenico Barretta,
A1 - William Fornaciari,
A1 - Mariagiovanna Sami,
A1 - Daniele Bagni,
PY - 2005
KW - null
VL - 2
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Domenico Barretta, Politecnico di Milano
William Fornaciari, Politecnico di Milano
Mariagiovanna Sami, Politecnico di Milano
Daniele Bagni, STMicroelectronics
Instruction Level Parallelism (ILP) extraction for multi-cluster VLIW processors is a very hard task. In this paper, we propose a retargetable architecture that can exploit ILP and thread level parallelism jointly, thus allowing an easier parallelism extraction and improving the performance with respect to traditional multicluster VLIW processors.
Citation:
Domenico Barretta, William Fornaciari, Mariagiovanna Sami, Daniele Bagni, "Multithreaded Extension to Multicluster VLIW Processors for Embedded Applications," date, vol. 2, pp.748-749, Design, Automation and Test in Europe (DATE'05) Volume 2, 2005
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