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Design, Automation and Test in Europe (DATE'05) Volume 1
Munich, Germany
March 07-March 11
ISBN: 0-7695-2288-2
ASCII Text
x 
 
Pekka Syri, Juha Hakkinen, Markku Moilanen, "IEEE 1149.4 Compatible ABMs for Basic RF Measurements," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 172-173, Design, Automation and Test in Europe (DATE'05) Volume 1, 2005.
 
 
BibTex
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@article{ 10.1109/DATE.2005.178,
author = {Pekka Syri and Juha Hakkinen and Markku Moilanen},
title = {IEEE 1149.4 Compatible ABMs for Basic RF Measurements},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {1},
year = {2005},
issn = {1530-1591},
pages = {172-173},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.178},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - IEEE 1149.4 Compatible ABMs for Basic RF Measurements
SN - 1530-1591
SP172
EP173
A1 - Pekka Syri,
A1 - Juha Hakkinen,
A1 - Markku Moilanen,
PY - 2005
KW - null
VL - 1
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Pekka Syri, University of Oulu, Finland
Juha Hakkinen, University of Oulu, Finland
Markku Moilanen, University of Oulu, Finland
An analogue testing standard IEEE 1149.4 is mainly targeted for low-frequency testing. The problem studied in this paper is extending the standard also for radio frequency testing. IEEE 1149.4 compatible measurement structures (ABMs) developed in this study extract the information one is measuring from the radio frequency signal and represent the result as a DC voltage level. The ABMs presented in this paper are targeted for power and frequency measurements operating in frequencies from 1 GHz to 2 GHz. The power measurement error caused by temperature, supply voltage and process variations is roughly 2 dB and the frequency measurement error is 0.1 GHz, respectively.
Citation:
Pekka Syri, Juha Hakkinen, Markku Moilanen, "IEEE 1149.4 Compatible ABMs for Basic RF Measurements," date, vol. 1, pp.172-173, Design, Automation and Test in Europe (DATE'05) Volume 1, 2005
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