Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04) Synthesis for Manufacturability: A Sanity Check Paris, France February 16-February 20 ISBN: 0-7695-2085-5
As we move towards nanometer technology, manufacturing problems become overwhelmingly difficult to solve. Presently, optimization for manufacturability is performed at a post-synthesis stage and has been shown capable of reducing manufacturing cost up to 10%. As in other cases, raising the abstraction layer where optimization is applied is expected to yield substantial gains. This paper focuses on a new approach to design for manufacturability: logic synthesis for manufacturability. This methodology consists of replacing the traditional area-driven technology mapping with a new manufacturability-driven one. We leverage existing logic synthesis tools to test our method. The results obtained by using STMicroelectronics 0.13?m library confirm that this approach is a promising solution for designing circuits with lower manufacturing cost, while retaining performance. Finally, we show that our synthesis for manufacturability can achieve even larger cost reduction when yield-optimized cells are added to the library, thus enabling a wider area-yield tradeoff exploration.
Citation:
Alessandra Nardi, Alberto L. Sangiovanni-Vincentelli, "Synthesis for Manufacturability: A Sanity Check," date, vol. 2, pp.20796, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||