Hideyuki Ichihara, Tomoo Inoue, "Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 11180, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.

@article{ 10.1109/DATE.2003.10057,
author = {Hideyuki Ichihara and Tomoo Inoue},
title = {Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {1},
year = {2003},
issn = {1530-1591},
pages = {11180},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10057},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG
SN - 1530-1591
SP
EP
A1 - Hideyuki Ichihara,
A1 - Tomoo Inoue,
PY - 2003
KW - null
VL - 1
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -