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Design, Automation and Test in Europe Conference and Exhibition (DATE'03)
Linear Model-Based Error Identification and Calibration for Data Converters
Munich, Germany
March 03-March 07
ISBN: 0-7695-1870-2
Carsten Wegener, University College Cork
Michael Peter Kennedy, University College Cork
For the example of a 12-bit Nyquist-rate ADC, a model for nonlinearity-causing mechanisms is developed based on circuit simulations. The model is used to estimate circuit element values from measured device characteristics. Post-manufacture reconfiguration of the digital control part of the device-type that is used as a test vehicle in this work can improve the linearity performance of a device. An algorithm is proposed that searches for a locally-optimal reconfiguration based on the determined circuit element values. Applying calibration to the circuit simulation model allows one to estimate the performance improvement obtainable with the proposed calibration scheme for a given manufacturing process prior to a physical implementation.
Citation:
Carsten Wegener, Michael Peter Kennedy, "Linear Model-Based Error Identification and Calibration for Data Converters," date, vol. 1, pp.10630, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003
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