Design, Automation and Test in Europe Conference and Exhibition (DATE'03) Linear Model-Based Error Identification and Calibration for Data Converters Munich, Germany March 03-March 07 ISBN: 0-7695-1870-2
For the example of a 12-bit Nyquist-rate ADC, a model for nonlinearity-causing mechanisms is developed based on circuit simulations. The model is used to estimate circuit element values from measured device characteristics. Post-manufacture reconfiguration of the digital control part of the device-type that is used as a test vehicle in this work can improve the linearity performance of a device. An algorithm is proposed that searches for a locally-optimal reconfiguration based on the determined circuit element values. Applying calibration to the circuit simulation model allows one to estimate the performance improvement obtainable with the proposed calibration scheme for a given manufacturing process prior to a physical implementation.
Citation:
Carsten Wegener, Michael Peter Kennedy, "Linear Model-Based Error Identification and Calibration for Data Converters," date, vol. 1, pp.10630, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||