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2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02)
Internet-Based Collaborative Test Generation with MOSCITO
Paris, France
March 04-March 08
ISBN: 0-7695-1471-5
ASCII Text
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A. Schneider, K. Diener, E. Ivask, J. Raik, R. Ubar, P. Miklos, T. Cibáková, E. Gramatová, "Internet-Based Collaborative Test Generation with MOSCITO," Design, Automation and Test in Europe Conference and Exhibition, pp. 0221, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002.
 
 
BibTex
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@article{ 10.1109/DATE.2002.998273,
author = {A. Schneider and K. Diener and E. Ivask and J. Raik and R. Ubar and P. Miklos and T. Cibáková and E. Gramatová},
title = {Internet-Based Collaborative Test Generation with MOSCITO},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {2002},
isbn = {0-7695-1471-5},
pages = {0221},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2002.998273},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Internet-Based Collaborative Test Generation with MOSCITO
SN - 0-7695-1471-5
SP
EP
A1 - A. Schneider,
A1 - K. Diener,
A1 - E. Ivask,
A1 - J. Raik,
A1 - R. Ubar,
A1 - P. Miklos,
A1 - T. Cibáková,
A1 - E. Gramatová,
PY - 2002
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
This paper offers an Internet-based environment for enhancing problem-specific design flows with test pattern generation and fault simulation capabilities. Automatic Test Pattern Generation (ATPG) and fault simulation tools at structural and hierarchical levels available at geographically different places running under the virtual environment using the MOSCITO system are presented. These tools can be used separately, or in multiple applications, for test pattern generation of digital circuits. In order to link different tools together and with commercial design systems, respectively a set of translators was developed. The functionality of the integrated design and test system was verified by several benchmark circuits.
Citation:
A. Schneider, K. Diener, E. Ivask, J. Raik, R. Ubar, P. Miklos, T. Cibáková, E. Gramatová, "Internet-Based Collaborative Test Generation with MOSCITO," date, pp.0221, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002
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