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Design, Automation and Test in Europe (DATE '99)
Glitch Power Minimization by Gate Freezing
Munich, Germany
March 09-March 12
ISBN: 0-7695-0078-1
L. Benini, Universit? di Bologna
G. de Micheli, Stanford University
A. Macii, Politecnico di Torino
E. Macii, Politecnico di Torino
M. Poncino, Politecnico di Torino
R. Scarsi, Politecnico di Torino
This paper presents a technique for glitch power minimization in combinational circuits. The total number of glitches is reduced by replacing some existing gates with functionally equivalent ones (called F-Gates) that can be frozen by asserting a control signal. A frozen gate cannot propagate glitches to its output. An important feature of the proposed method is that it can be applied in-place directly to layout-level descriptions; therefore, it guarantees very predictable results and minimizes the impact of the transformation on circuit size and speed.
Citation:
L. Benini, G. de Micheli, A. Macii, E. Macii, M. Poncino, R. Scarsi, "Glitch Power Minimization by Gate Freezing," date, pp.163, Design, Automation and Test in Europe (DATE '99), 1999
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