P. Nordholz, H. Grabinski, D. Treytnar, J. Otterstedt, D. Niggemeyer, U. Arz, T.W. Williams, "Core Interconnect Testing Hazards," Design, Automation and Test in Europe Conference and Exhibition, pp. 953, Design Automation and Test in Europe (DATE '98), 1998.

@article{ 10.1109/DATE.1998.655985,
author = {P. Nordholz and H. Grabinski and D. Treytnar and J. Otterstedt and D. Niggemeyer and U. Arz and T.W. Williams},
title = {Core Interconnect Testing Hazards},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {1998},
isbn = {0-8186-8359-7},
pages = {953},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.1998.655985},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Core Interconnect Testing Hazards
SN - 0-8186-8359-7
SP
EP
A1 - P. Nordholz,
A1 - H. Grabinski,
A1 - D. Treytnar,
A1 - J. Otterstedt,
A1 - D. Niggemeyer,
A1 - U. Arz,
A1 - T.W. Williams,
PY - 1998
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -