Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique

D
DATE
1998
Design Automation and Test in Europe (DATE '98)
Abstract - Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique

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	Similar Articles Articles by M.L. Flottes Articles by R. Pires Articles by B. Rouzeyre Articles by L. Volpe

Design Automation and Test in Europe (DATE '98)

Paris, France

February 23-February 26

ISBN: 0-8186-8359-7

	ASCII Text	x
	M.L. Flottes, R. Pires, B. Rouzeyre, L. Volpe, "Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique," Design, Automation and Test in Europe Conference and Exhibition, pp. 921, Design Automation and Test in Europe (DATE '98), 1998.

	BibTex	x
	@article{ 10.1109/DATE.1998.655969, author = {M.L. Flottes and R. Pires and B. Rouzeyre and L. Volpe}, title = {Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {0}, year = {1998}, isbn = {0-8186-8359-7}, pages = {921}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.1998.655969}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique SN - 0-8186-8359-7 SP EP A1 - M.L. Flottes, A1 - R. Pires, A1 - B. Rouzeyre, A1 - L. Volpe, PY - 1998 KW - Partial scan KW - Scan chain selection KW - Synthesis for testability KW - RT and gate levels VL - 0 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

M.L. Flottes, Micro?lectronique de Montpellier,U.M. CNRS 9928

R. Pires, Micro?lectronique de Montpellier,U.M. CNRS 9928

B. Rouzeyre, Micro?lectronique de Montpellier,U.M. CNRS 9928

L. Volpe, Micro?lectronique de Montpellier,U.M. CNRS 9928

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.1998.655969

In this paper, we present a method for quickly identifying the scan path chain of datapaths. The originality of the method resides in working with both RT and gate-level level descriptions of circuits. The proposed technique results in a very significant reduction on the CPU time required for scan path selection. We investigate also some directions for the incorporation of partial scan methodology within High Level Synthesis for Testability.

Index Terms:

Partial scan, Scan chain selection, Synthesis for testability, RT and gate levels

Citation:

M.L. Flottes, R. Pires, B. Rouzeyre, L. Volpe, "Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique," date, pp.921, Design Automation and Test in Europe (DATE '98), 1998

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