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2nd IEEE International Symposium on Dependable, Autonomic and Secure Computing (DASC'06)
Estimating Markov Modulated Software Reliability Models via EM Algorithm
Indiana University-Purdue University, Indianapolis, USA
September 29-October 01
ISBN: 0-7695-2539-3
ASCII Text
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Takao Ando, Hiroyuki Okamura, Tadashi Dohi, "Estimating Markov Modulated Software Reliability Models via EM Algorithm," Dependable, Autonomic and Secure Computing, IEEE International Symposium on, pp. 111-118, 2nd IEEE International Symposium on Dependable, Autonomic and Secure Computing (DASC'06), 2006.
 
 
BibTex
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@article{ 10.1109/DASC.2006.29,
author = {Takao Ando and Hiroyuki Okamura and Tadashi Dohi},
title = {Estimating Markov Modulated Software Reliability Models via EM Algorithm},
journal ={Dependable, Autonomic and Secure Computing, IEEE International Symposium on},
volume = {0},
year = {2006},
isbn = {0-7695-2539-3},
pages = {111-118},
doi = {http://doi.ieeecomputersociety.org/10.1109/DASC.2006.29},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Dependable, Autonomic and Secure Computing, IEEE International Symposium on
TI - Estimating Markov Modulated Software Reliability Models via EM Algorithm
SN - 0-7695-2539-3
SP111
EP118
A1 - Takao Ando,
A1 - Hiroyuki Okamura,
A1 - Tadashi Dohi,
PY - 2006
KW - Software reliability models
KW - Markov modulated processes
KW - EM algorithm
KW - Information criterion
VL - 0
JA - Dependable, Autonomic and Secure Computing, IEEE International Symposium on
ER -
 
Takao Ando, Hiroshima University, Japan
Hiroyuki Okamura, Hiroshima University, Japan
Tadashi Dohi, Hiroshima University, Japan
In this paper, we develop a parameter estimation method to Markovian software reliability models. When software fault-detection rates change in the software testing phase, fault-detection processes can be generally modeled by Markov modulated processes. This paper deals with a unified parameter estimation method for Markov modulated software reliability models as well as the typical pure birth process models. In numerical examples, we evaluate a goodness-of-fit for the Markov modulated software reliability models with real fault data, and show numerically that the Markov modulated software reliability models are superior to the existing pure birth process models in the viewpoint of information criterion.
Index Terms:
Software reliability models, Markov modulated processes, EM algorithm, Information criterion
Citation:
Takao Ando, Hiroyuki Okamura, Tadashi Dohi, "Estimating Markov Modulated Software Reliability Models via EM Algorithm," dasc, pp.111-118, 2nd IEEE International Symposium on Dependable, Autonomic and Secure Computing (DASC'06), 2006
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