2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Volume 2 (CVPR'06) Spatial Reflectance Recovery under Complex Illumination from Sparse Images New York, NY June 17-June 22 ISBN: 0-7695-2597-0
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/CVPR.2006.287
A major challenge in inverse reflectometry is the acquisition of spatially varying materials. In this paper, we introduce a method to recover spatial reflectance from a sparse set of images under general illumination. Specifically, we first remove the high-frequency varying diffuse reflection term by using a low-order spherical harmonic approximation. This allows us to directly estimate the specular properties with a cluster fitting process, which simplifies the fitting processes and addresses the problem of data inadequacy for sparse images. As a result, we can reconstruct a truly spatially varying BRDF model of the surface from less than 10 images. Experimental results will be presented in order to demonstrate the effectiveness of the proposed algorithm.
Citation:
Li Shen, Haruo Takemura, "Spatial Reflectance Recovery under Complex Illumination from Sparse Images," cvpr, vol. 2, pp.1833-1838, 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Volume 2 (CVPR'06), 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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