2004 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'04) Volume 11 Precise Simultaneous Estimation of Image Deformation Parameters Washington, D.C., USA June 27-July 02 ISBN: 0-7695-2158-4
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/CVPR.2004.420
This paper presents a new method to obtain simultaneously precise N parameters of image deformation with non-iterative calculation by extending area-based matching and sub-pixel estimation. Although area-based matching and similarity interpolation for sub-pixel displacement estimation are commonly used in many areas as a fundamental procedure, they are bound to simple translation.The proposed method is based on a practical similarity model in N-dimensional parameter space. Using similarity measures obtained at discrete positions in the parameter space, our method provides a highly accurate maximum position of similarity in sub-sampling resolution; that position corresponds to image deformation parameters. Experimental results using both synthetic and real images demonstrate that our method can estimate parameters more accurately than previous methods.
Citation:
Masao Shimizu, Takahiro Yano, Masatoshi Okutomi, "Precise Simultaneous Estimation of Image Deformation Parameters," cvprw, vol. 11, pp.175, 2004 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'04) Volume 11, 2004 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||