Third International Conference on Application of Concurrency to System Design (ACSD'03) Specification Coverage Aided Test Selection Guimar?es, Portugal June 18-June 20 ISBN: 0-7695-1887-7
In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.
Citation:
Tuomo Pyhälä, Keijo Heljanko, "Specification Coverage Aided Test Selection," acsd, pp.187, Third International Conference on Application of Concurrency to System Design (ACSD'03), 2003 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||