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29th Annual International Computer Software and Applications Conference (COMPSAC'05) Volume 1
Software Test Selection Patterns and Elusive Bugs
Edinburgh, Scotland
July 26-July 28
ISBN: 0-7695-2413-3
ASCII Text
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William E. Howden, "Software Test Selection Patterns and Elusive Bugs," Computer Software and Applications Conference, Annual International, vol. 1, pp. 25-32, 29th Annual International Computer Software and Applications Conference (COMPSAC'05) Volume 1, 2005.
 
 
BibTex
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@article{ 10.1109/COMPSAC.2005.143,
author = {William E. Howden},
title = {Software Test Selection Patterns and Elusive Bugs},
journal ={Computer Software and Applications Conference, Annual International},
volume = {1},
year = {2005},
issn = {0730-3157},
pages = {25-32},
doi = {http://doi.ieeecomputersociety.org/10.1109/COMPSAC.2005.143},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Computer Software and Applications Conference, Annual International
TI - Software Test Selection Patterns and Elusive Bugs
SN - 0730-3157
SP25
EP32
A1 - William E. Howden,
PY - 2005
KW - Testing
KW - patterns
KW - defects
KW - elusive
KW - models
KW - design
VL - 1
JA - Computer Software and Applications Conference, Annual International
ER -
 
William E. Howden, University of California at San Diego
Traditional white and black box testing methods are effective in revealing many kinds of defects, but the more elusive bugs slip past them. Model-based testing incorporates additional application concepts in the selection of tests, which may provide more refined bug detection, but does not go far enough. Test selection patterns identify defect-oriented contexts in a program. They also identify suggested tests for risks associated with a specified context. A context and its risks is a kind of conceptual trap designed to corner a bug. The suggested tests will find the bug if it has been caught in the trap.
Index Terms:
Testing, patterns, defects, elusive, models, design
Citation:
William E. Howden, "Software Test Selection Patterns and Elusive Bugs," compsac, vol. 1, pp.25-32, 29th Annual International Computer Software and Applications Conference (COMPSAC'05) Volume 1, 2005
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