A Memory-Based Reasoning Approach for Assessing Software Quality

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Raymond A. Paul Articles by Venkata U.B. Challagulla Articles by Farokh B. Bastani Articles by I-Ling Yen

25th Annual International Computer Software and Applications Conference (COMPSAC'01)

Chicago, Illinois

October 08-October 12

ISBN: 0-7695-1372-7

	ASCII Text	x
	Raymond A. Paul, Venkata U.B. Challagulla, Farokh B. Bastani, I-Ling Yen, "A Memory-Based Reasoning Approach for Assessing Software Quality," Computer Software and Applications Conference, Annual International, pp. 97, 25th Annual International Computer Software and Applications Conference (COMPSAC'01), 2001.

	BibTex	x
	@article{ 10.1109/CMPSAC.2001.960603, author = {Raymond A. Paul and Venkata U.B. Challagulla and Farokh B. Bastani and I-Ling Yen}, title = {A Memory-Based Reasoning Approach for Assessing Software Quality}, journal ={Computer Software and Applications Conference, Annual International}, volume = {0}, year = {2001}, issn = {0730-3157}, pages = {97}, doi = {http://doi.ieeecomputersociety.org/10.1109/CMPSAC.2001.960603}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Software and Applications Conference, Annual International TI - A Memory-Based Reasoning Approach for Assessing Software Quality SN - 0730-3157 SP EP A1 - Raymond A. Paul, A1 - Venkata U.B. Challagulla, A1 - Farokh B. Bastani, A1 - I-Ling Yen, PY - 2001 KW - Software metrics repository KW - Mission Critical Systems KW - Metrics data analysis KW - Software reliability KW - Y2K defects. VL - 0 JA - Computer Software and Applications Conference, Annual International ER -

Raymond A. Paul, Department of Defense

Venkata U.B. Challagulla, Univ. of Texas at Dallas

Farokh B. Bastani, Univ. of Texas at Dallas

I-Ling Yen, Univ. of Texas at Dallas

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/CMPSAC.2001.960603

Several methods have been explored for assuring the reliability of Mission Critical Systems (MCS), but no single method has proved to be completely effective. This paper presents an approach for quantifying the confidence in the probability that a program is free of specific classes of defects. The method uses memory-based reasoning techniques to admit a variety of data from a variety of projects for the purpose of assessing new systems. Once a sufficient amount of information has been collected, the statistical results can be applied to programs that are not in the analysis set to predict their reliabilities and guide the testing process. The approach is applied to the analysis of Y2K defects based on defect data generated using fault-injection simulation.

Index Terms:

Software metrics repository, Mission Critical Systems, Metrics data analysis, Software reliability, Y2K defects.

Citation:

Raymond A. Paul, Venkata U.B. Challagulla, Farokh B. Bastani, I-Ling Yen, "A Memory-Based Reasoning Approach for Assessing Software Quality," compsac, pp.97, 25th Annual International Computer Software and Applications Conference (COMPSAC'01), 2001

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.