C. Hagwood, R. Kacker, J. Yen, D. Banks, L. Rosenthal, L. Gallagher, P. Black, "Reliability of Conformance Tests," Computer Software and Applications Conference, Annual International, pp. 368, 22nd International Computer Software and Application Conference, 1998.

@article{ 10.1109/CMPSAC.1998.716682,
author = {C. Hagwood and R. Kacker and J. Yen and D. Banks and L. Rosenthal and L. Gallagher and P. Black},
title = {Reliability of Conformance Tests},
journal ={Computer Software and Applications Conference, Annual International},
volume = {0},
year = {1998},
issn = {0730-3157},
pages = {368},
doi = {http://doi.ieeecomputersociety.org/10.1109/CMPSAC.1998.716682},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Computer Software and Applications Conference, Annual International
TI - Reliability of Conformance Tests
SN - 0730-3157
SP
EP
A1 - C. Hagwood,
A1 - R. Kacker,
A1 - J. Yen,
A1 - D. Banks,
A1 - L. Rosenthal,
A1 - L. Gallagher,
A1 - P. Black,
PY - 1998
VL - 0
JA - Computer Software and Applications Conference, Annual International
ER -