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Sixth IEEE International Conference on Computer and Information Technology (CIT'06)
Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions
Seoul, Korea
September 20-September 22
ISBN: 0-7695-2687-X
ASCII Text
x 
 
Chang-ai Sun, Yunwei Dong, R. Lai, K.Y. Sim, T.Y. Chen, "Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions," Computer and Information Technology, International Conference on, pp. 184, Sixth IEEE International Conference on Computer and Information Technology (CIT'06), 2006.
 
 
BibTex
x
 
@article{ 10.1109/CIT.2006.51,
author = {Chang-ai Sun and Yunwei Dong and R. Lai and K.Y. Sim and T.Y. Chen},
title = {Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions},
journal ={Computer and Information Technology, International Conference on},
volume = {0},
year = {2006},
isbn = {0-7695-2687-X},
pages = {184},
doi = {http://doi.ieeecomputersociety.org/10.1109/CIT.2006.51},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Computer and Information Technology, International Conference on
TI - Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions
SN - 0-7695-2687-X
SP
EP
A1 - Chang-ai Sun,
A1 - Yunwei Dong,
A1 - R. Lai,
A1 - K.Y. Sim,
A1 - T.Y. Chen,
PY - 2006
KW - null
VL - 0
JA - Computer and Information Technology, International Conference on
ER -
 
Chang-ai Sun, Swinburne University of Technology, Australia
Yunwei Dong, Swinburne University of Technology, Australia
R. Lai, La Trobe University, Australia
K.Y. Sim, Swinburne University of Technology, Malaysia
T.Y. Chen, Swinburne University of Technology, Australia
Boolean expressions are widely used to model decisions or conditions of a specification or source program. The MUMCUT, which is designed to detect seven common faults where Boolean expressions under test are assumed to be in Irredundant Disjunctive Normal Form (IDNF), is an efficient fault-based test case selection strategy in terms of the fault-detection capacity and the size of selected test suite. Following up our previous work that reported the fault-detection capacity of the MUMCUT when it is applied to general form Boolean expressions, in this paper we present the characteristic of the types of single faults committed in general Boolean expressions that a MUMCUT test suite fails to detect, analyze the certainty why a MUMCUT test suite fails to detect these types of undetected faults, and provide some extensions to enhance the detection capacity of the MUMCUT for these types of undetected faults.
Citation:
Chang-ai Sun, Yunwei Dong, R. Lai, K.Y. Sim, T.Y. Chen, "Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions," cit, pp.184, Sixth IEEE International Conference on Computer and Information Technology (CIT'06), 2006
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