loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
International Symposium on Code Generation and Optimization (CGO'03)
METRIC: Tracking Down Inefficiencies in the Memory Hierarchy via Binary Rewriting
San Francisco, California
March 23-March 26
ISBN: 0-7695-1913-X
Jaydeep Marathe, North Carolina State University
Frank Mueller, North Carolina State University
Tushar Mohan, University of Utah
Bronis R.de Supinski, Lawrence Livermore National Lab
Sally A. McKee, Cornell University
Andy Yoo, Lawrence Livermore National Lab
In this paper, we present METRIC, an environment for determining memory inefficiencies by examining data traces. METRIC is designed to alter the performance behavior of applications that are mostly constrained by their latency to resolve memory references. We make four primary contributions in this paper. First, we present methods to extract partial data traces from running applications by observing their memory behavior via dynamic binary rewriting. Second, we present a methodology to represent partial data traces in constant space for regular references through a novel technique for online compression of reference streams. Third, we employ offline cache simulation to derive indications about memory performance bottlenecks from partial data traces. By exploiting summarized memory metrics, by-reference metrics as well as cache evictor information, we can pin-point the sources of performance problems. Fourth, we demonstrate the ability to derive opportunities for optimizations and assess their benefits in several experiments resulting in up to 40% lower miss ratios.
Citation:
Jaydeep Marathe, Frank Mueller, Tushar Mohan, Bronis R.de Supinski, Sally A. McKee, Andy Yoo, "METRIC: Tracking Down Inefficiencies in the Memory Hierarchy via Binary Rewriting," cgo, pp.289, International Symposium on Code Generation and Optimization (CGO'03), 2003
Usage of this product signifies your acceptance of the Terms of Use.