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International Conference on Computer Graphics, Imaging and Visualisation (CGIV'06)
Improved Three-step Phase Shifting Profilometry Using Digital Fringe Pattern Projection
Sydney, Australia
July 26-July 28
ISBN: 0-7695-2606-3
ASCII Text
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Yingsong Hu, Jiangtao Xi, Joe Chicharo, Zongkai Yang, "Improved Three-step Phase Shifting Profilometry Using Digital Fringe Pattern Projection," Computer Graphics, Imaging and Visualization, International Conference on, pp. 161-167, International Conference on Computer Graphics, Imaging and Visualisation (CGIV'06), 2006.
 
 
BibTex
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@article{ 10.1109/CGIV.2006.58,
author = {Yingsong Hu and Jiangtao Xi and Joe Chicharo and Zongkai Yang},
title = {Improved Three-step Phase Shifting Profilometry Using Digital Fringe Pattern Projection},
journal ={Computer Graphics, Imaging and Visualization, International Conference on},
volume = {0},
year = {2006},
isbn = {0-7695-2606-3},
pages = {161-167},
doi = {http://doi.ieeecomputersociety.org/10.1109/CGIV.2006.58},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Computer Graphics, Imaging and Visualization, International Conference on
TI - Improved Three-step Phase Shifting Profilometry Using Digital Fringe Pattern Projection
SN - 0-7695-2606-3
SP161
EP167
A1 - Yingsong Hu,
A1 - Jiangtao Xi,
A1 - Joe Chicharo,
A1 - Zongkai Yang,
PY - 2006
KW - null
VL - 0
JA - Computer Graphics, Imaging and Visualization, International Conference on
ER -
 
Yingsong Hu, University of Wollongong, Australia
Jiangtao Xi, University of Wollongong, Australia
Joe Chicharo, University of Wollongong, Australia
Zongkai Yang, Huazhong University of Science and Technology, China
In this paper, an improved method for three-step phase shifting profilometry (PSP) is presented to eliminate the errors introduced by the second order harmonic when digital projection are used to generate fringe patterns. Firstly, the error caused by the second order harmonic is theoretically analyzed. Then based on the error analysis and principle of PSP, we propose a novel approach, called improved threestep phase shifting profilometry (I3PSP), to eliminate the influence of the second order harmonic. Finally, simulations are performed to verify the effectiveness of the proposed I3PSP, which demonstrate that the reconstruction accuracy of using three-step PSP has been significantly improved by the proposed I3PSP.
Citation:
Yingsong Hu, Jiangtao Xi, Joe Chicharo, Zongkai Yang, "Improved Three-step Phase Shifting Profilometry Using Digital Fringe Pattern Projection," cgiv, pp.161-167, International Conference on Computer Graphics, Imaging and Visualisation (CGIV'06), 2006
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