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21st Annual IEEE Conference on Computational Complexity (CCC'06)
FO[\le]-Uniformity
Prague, Czech Republic
July 16-July 20
ISBN: 0-7695-2596-2
ASCII Text
x 
 
Christoph Behl, Klaus-Jorn Lange, "FO[\le]-Uniformity," Computational Complexity, Annual IEEE Conference on, pp. 183-189, 21st Annual IEEE Conference on Computational Complexity (CCC'06), 2006.
 
 
BibTex
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@article{ 10.1109/CCC.2006.20,
author = {Christoph Behl and Klaus-Jorn Lange},
title = {FO[\le]-Uniformity},
journal ={Computational Complexity, Annual IEEE Conference on},
volume = {0},
year = {2006},
issn = {1093-0159},
pages = {183-189},
doi = {http://doi.ieeecomputersociety.org/10.1109/CCC.2006.20},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Computational Complexity, Annual IEEE Conference on
TI - FO[\le]-Uniformity
SN - 1093-0159
SP183
EP189
A1 - Christoph Behl,
A1 - Klaus-Jorn Lange,
PY - 2006
KW - null
VL - 0
JA - Computational Complexity, Annual IEEE Conference on
ER -
 
Christoph Behl, Universitat Tubingen, Germany
Klaus-Jorn Lange, Universitat Tubingen, Germany
Uniformity notions more restrictive than the usual FO[\le,+, ]-uniformity = FO[\le,Bit]-uniformity are introduced. It is shown that the general framework exhibited by Barrington et al. still holds if the fan-in of the gates in the corresponding circuits is considered.
Citation:
Christoph Behl, Klaus-Jorn Lange, "FO[\le]-Uniformity," ccc, pp.183-189, 21st Annual IEEE Conference on Computational Complexity (CCC'06), 2006
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