Exposure-Resilient Extractors

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21st Annual IEEE Conference on Computational Complexity (CCC'06)

Prague, Czech Republic

July 16-July 20

ISBN: 0-7695-2596-2

	ASCII Text	x
	Marius Zimand, "Exposure-Resilient Extractors," Computational Complexity, Annual IEEE Conference on, pp. 61-72, 21st Annual IEEE Conference on Computational Complexity (CCC'06), 2006.

	BibTex	x
	@article{ 10.1109/CCC.2006.19, author = {Marius Zimand}, title = {Exposure-Resilient Extractors}, journal ={Computational Complexity, Annual IEEE Conference on}, volume = {0}, year = {2006}, issn = {1093-0159}, pages = {61-72}, doi = {http://doi.ieeecomputersociety.org/10.1109/CCC.2006.19}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computational Complexity, Annual IEEE Conference on TI - Exposure-Resilient Extractors SN - 1093-0159 SP61 EP72 A1 - Marius Zimand, PY - 2006 KW - null VL - 0 JA - Computational Complexity, Annual IEEE Conference on ER -

Marius Zimand, Towson University, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/CCC.2006.19

An exposure-resilient extractor is an efficient procedure that, from a random variable with imperfect min-entropy, produces randomness that passes all statistical tests including those that have bounded access to the random variable, with adaptive queries that can depend on the string beiing tested.

Citation:

Marius Zimand, "Exposure-Resilient Extractors," ccc, pp.61-72, 21st Annual IEEE Conference on Computational Complexity (CCC'06), 2006

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