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21st Annual IEEE Conference on Computational Complexity (CCC'06)
Exposure-Resilient Extractors
Prague, Czech Republic
July 16-July 20
ISBN: 0-7695-2596-2
ASCII Text
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Marius Zimand, "Exposure-Resilient Extractors," Computational Complexity, Annual IEEE Conference on, pp. 61-72, 21st Annual IEEE Conference on Computational Complexity (CCC'06), 2006.
 
 
BibTex
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@article{ 10.1109/CCC.2006.19,
author = {Marius Zimand},
title = {Exposure-Resilient Extractors},
journal ={Computational Complexity, Annual IEEE Conference on},
volume = {0},
year = {2006},
issn = {1093-0159},
pages = {61-72},
doi = {http://doi.ieeecomputersociety.org/10.1109/CCC.2006.19},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Computational Complexity, Annual IEEE Conference on
TI - Exposure-Resilient Extractors
SN - 1093-0159
SP61
EP72
A1 - Marius Zimand,
PY - 2006
KW - null
VL - 0
JA - Computational Complexity, Annual IEEE Conference on
ER -
 
Marius Zimand, Towson University, USA
An exposure-resilient extractor is an efficient procedure that, from a random variable with imperfect min-entropy, produces randomness that passes all statistical tests including those that have bounded access to the random variable, with adaptive queries that can depend on the string beiing tested.
Citation:
Marius Zimand, "Exposure-Resilient Extractors," ccc, pp.61-72, 21st Annual IEEE Conference on Computational Complexity (CCC'06), 2006
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