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2008 International Conference on BioMedical Engineering and Informatics
Logit-transformation Based Confidence Intervals for the Sensitivity of a Continuous-scale Diagnostic Test
May 27-May 30
ISBN: 978-0-7695-3118-2
In the field of modern medicine, diagnostic tests play an important role in detecting diseased patients. The diagnostic accuracy of a test is measured by its sensitivity and specificity. In this paper, we focus on the interval estimation for the sensitivity of a continuous-scale diagnostic test at a fixed level of its specificity. We propose two logit-transformation based confidence intervals for the sensitivity of a test and compare them with two of the best existing intervals (BTI and BTII) proposed by Zhou and Qin [5]. Our simulation studies show that the newly proposed logit-transformation based intervals (LTI and LTII) have shorter interval lengths than the existing BTI and BTII intervals. The applications of the new intervals are illustrated in two real examples.
Citation:
Jihye Kim, Gengsheng Qin, "Logit-transformation Based Confidence Intervals for the Sensitivity of a Continuous-scale Diagnostic Test," bmei, vol. 2, pp.768-772, 2008 International Conference on BioMedical Engineering and Informatics, 2008
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