2009 Asian Test Symposium Multi-tone Testing of Linear and Nonlinear Analog Circuits Using Polynomial Coefficients Taichung, Taiwan November 23-November 26 ISBN: 978-0-7695-3864-8
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2009.45
A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the applied input voltage at relevant frequencies in addition to DC. Classification of CUT is based on a comparison of the estimated polynomial coefficients with those of the fault free circuit. This testing method requires no design for test hardware as might be added to the circuit by some other methods. The proposed method is illustrated for a benchmark elliptic filter. It is shown to uncover several parametric faults causing deviations as small as 5% from the nominal values.
Index Terms:
Multi-tone test, Parametric faults, Analog circuit test, Curve fitting, Polynomial coefficient testing
Citation:
Suraj Sindia, Virendra Singh, Vishwani D. Agrawal, "Multi-tone Testing of Linear and Nonlinear Analog Circuits Using Polynomial Coefficients," ats, pp.63-68, 2009 Asian Test Symposium, 2009 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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