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2009 Asian Test Symposium
Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns
Taichung, Taiwan
November 23-November 26
ISBN: 978-0-7695-3864-8
ASCII Text
x 
 
Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen, "Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns," Asian Test Symposium, pp. 35-40, 2009 Asian Test Symposium, 2009.
 
 
BibTex
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@article{ 10.1109/ATS.2009.36,
author = {Yu Huang and Wu-Tung Cheng and Ruifeng Guo and Ting-Pu Tai and Feng-Ming Kuo and Yuan-Shih Chen},
title = {Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns},
journal ={Asian Test Symposium},
volume = {0},
year = {2009},
issn = {1081-7735},
pages = {35-40},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.36},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Asian Test Symposium
TI - Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns
SN - 1081-7735
SP35
EP40
A1 - Yu Huang,
A1 - Wu-Tung Cheng,
A1 - Ruifeng Guo,
A1 - Ting-Pu Tai,
A1 - Feng-Ming Kuo,
A1 - Yuan-Shih Chen,
PY - 2009
KW - chain diagnosis
KW - signal profiling
KW - adaptive system
KW - physical failure analysis
VL - 0
JA - Asian Test Symposium
ER -
 
In the past, software based scan chain defect diagnosis can be roughly classified into two categories (1) model-based algorithms, and (2) data-driven algorithms. In this paper we first analyze the advantages and disadvantages of each category of the chain diagnosis algorithms. Next, an adaptive signal profiling algorithm that can use manufacturing ATPG scan patterns is proposed for scan chain diagnosis. Finally, several case studies and their PFA results are presented to validate the accuracy and effectiveness of the proposed algorithm.
Index Terms:
chain diagnosis, signal profiling, adaptive system, physical failure analysis
Citation:
Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen, "Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns," ats, pp.35-40, 2009 Asian Test Symposium, 2009
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