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2009 Asian Test Symposium
On Improving Diagnostic Test Generation for Scan Chain Failures
Taichung, Taiwan
November 23-November 26
ISBN: 978-0-7695-3864-8
ASCII Text
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Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy, Yu Huang, "On Improving Diagnostic Test Generation for Scan Chain Failures," Asian Test Symposium, pp. 41-46, 2009 Asian Test Symposium, 2009.
 
 
BibTex
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@article{ 10.1109/ATS.2009.21,
author = {Xun Tang and Ruifeng Guo and Wu-Tung Cheng and Sudhakar M. Reddy and Yu Huang},
title = {On Improving Diagnostic Test Generation for Scan Chain Failures},
journal ={Asian Test Symposium},
volume = {0},
year = {2009},
issn = {1081-7735},
pages = {41-46},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.21},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - On Improving Diagnostic Test Generation for Scan Chain Failures
SN - 1081-7735
SP41
EP46
A1 - Xun Tang,
A1 - Ruifeng Guo,
A1 - Wu-Tung Cheng,
A1 - Sudhakar M. Reddy,
A1 - Yu Huang,
PY - 2009
VL - 0
JA - Asian Test Symposium
ER -
 
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-cycle scan test patterns. A diagnostic test generation flow to speed up diagnosis is proposed to address the issue of long run times of test generation and large number of test patterns for the cases where the range of suspected cells is large. Experimental results on several industrial designs show the effectiveness of the proposed procedures in improving diagnostic resolution, reducing run times of test generation and also reducing the number of test patterns.
Citation:
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy, Yu Huang, "On Improving Diagnostic Test Generation for Scan Chain Failures," ats, pp.41-46, 2009 Asian Test Symposium, 2009
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