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14th Asian Test Symposium (ATS'05)
Scan Data Volume Reduction Using Periodically Alterable MUXs Decompressor
Calcutta, India
December 18-December 21
ISBN: 0-7695-2481-8
Yinhe Han, Computing Technology, Chinese Academy of Sciences, Beijing, China
Xiaowei Li, Computing Technology, Chinese Academy of Sciences, Beijing, China
Shivakumar Swaminathan, IBM Microelectronics, Research Triangle Park, NC
Yu Hu, Computing Technology, Chinese Academy of Sciences, Beijing, China
Anshuman Chandra, Synopsys, Inc. Mountain View, CA
This paper presents a decompression architecture using a periodically alterable MUXs decompressor for scan data volume reduction. Compared to static XOR network, the periodically alterable MUXs decompressor has multiple configurations to decode the input information more efficiently. Three different DFT techniques are proposed to handle hard, firm and soft cores, respectively. With the proposed pattern decompression algorithms and scan decompression architecture, smaller test data volume and test application time can be achieved as compared to previous techniques.
Citation:
Yinhe Han, Xiaowei Li, Shivakumar Swaminathan, Yu Hu, Anshuman Chandra, "Scan Data Volume Reduction Using Periodically Alterable MUXs Decompressor," ats, pp.372-377, 14th Asian Test Symposium (ATS'05), 2005
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