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14th Asian Test Symposium (ATS'05)
New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors
Calcutta, India
December 18-December 21
ISBN: 0-7695-2481-8
ASCII Text
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D. Marienfeld, E. S. Sogomonyan, V. Ocheretnij, M. Gossel, "New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors," Asian Test Symposium, pp. 76-81, 14th Asian Test Symposium (ATS'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/ATS.2005.80,
author = {D. Marienfeld and E. S. Sogomonyan and V. Ocheretnij and M. Gossel},
title = {New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors},
journal ={Asian Test Symposium},
volume = {0},
year = {2005},
issn = {1081-7735},
pages = {76-81},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.80},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors
SN - 1081-7735
SP76
EP81
A1 - D. Marienfeld,
A1 - E. S. Sogomonyan,
A1 - V. Ocheretnij,
A1 - M. Gossel,
PY - 2005
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
D. Marienfeld, University of Potsdam, Germany
E. S. Sogomonyan, University of Potsdam, Germany
V. Ocheretnij, University of Potsdam, Germany
M. Gossel, University of Potsdam, Germany
In this paper a new self-checking code-disjoint Booth-2 multiplier with an improved error detection and with a reduced area overhead is proposed. Compared to the 64?64 multiplier without error detection the area for the proposed multiplier increases for the different implementations only by 23%-30%. Especially for soft errors the error detection capability is significantly improved. All even or odd (soft) errors in the output registers are detected.
Citation:
D. Marienfeld, E. S. Sogomonyan, V. Ocheretnij, M. Gossel, "New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors," ats, pp.76-81, 14th Asian Test Symposium (ATS'05), 2005
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