IEEE Std 1500 Compliant Infrastructure forModular SOC Testing

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ATS
2005
14th Asian Test Symposium (ATS'05)
Abstract - IEEE Std 1500 Compliant Infrastructure forModular SOC Testing

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14th Asian Test Symposium (ATS'05)

IEEE Std 1500 Compliant Infrastructure forModular SOC Testing (PDF)

Calcutta, India

December 18-December 21

ISBN: 0-7695-2481-8

	ASCII Text	x
	Tom Waayers, Erik Jan Marinissen, Maurice Lousberg, "IEEE Std 1500 Compliant Infrastructure forModular SOC Testing," Asian Test Symposium, pp. 450, 14th Asian Test Symposium (ATS'05), 2005.

	BibTex	x
	@article{ 10.1109/ATS.2005.67, author = {Tom Waayers and Erik Jan Marinissen and Maurice Lousberg}, title = {IEEE Std 1500 Compliant Infrastructure forModular SOC Testing}, journal ={Asian Test Symposium}, volume = {0}, year = {2005}, issn = {1081-7735}, pages = {450}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.67}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - IEEE Std 1500 Compliant Infrastructure forModular SOC Testing SN - 1081-7735 SP EP A1 - Tom Waayers, A1 - Erik Jan Marinissen, A1 - Maurice Lousberg, PY - 2005 KW - null VL - 0 JA - Asian Test Symposium ER -

Tom Waayers, Philips Research Laboratories, The Netherlands

Erik Jan Marinissen, Philips Research Laboratories, The Netherlands

Maurice Lousberg, Philips Research Laboratories, The Netherlands

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2005.67

Modern semiconductor process technologies enable the manufacturing of a complete system on one single die, the so-called system-on-chip or SOC. Building those chips in a timely and cost-effective manner is amongst others realized by embedding third-party IP cores. Due to imperfections in silicon manufacturing, an SOC including all its embedded modules needs to be tested for manufacturing defects.

Citation:

Tom Waayers, Erik Jan Marinissen, Maurice Lousberg, "IEEE Std 1500 Compliant Infrastructure forModular SOC Testing," ats, pp.450, 14th Asian Test Symposium (ATS'05), 2005

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