IEEE Std 1500 Compliant Infrastructure forModular SOC Testing

	This Article
	PDF RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Tom Waayers Articles by Erik Jan Marinissen Articles by Maurice Lousberg

14th Asian Test Symposium (ATS'05)

IEEE Std 1500 Compliant Infrastructure forModular SOC Testing (PDF)

Calcutta, India

December 18-December 21

ISBN: 0-7695-2481-8

	ASCII Text	x
	Tom Waayers, Erik Jan Marinissen, Maurice Lousberg, "IEEE Std 1500 Compliant Infrastructure forModular SOC Testing," Asian Test Symposium, pp. 450, 14th Asian Test Symposium (ATS'05), 2005.

	BibTex	x
	@article{ 10.1109/ATS.2005.67, author = {Tom Waayers and Erik Jan Marinissen and Maurice Lousberg}, title = {IEEE Std 1500 Compliant Infrastructure forModular SOC Testing}, journal ={Asian Test Symposium}, volume = {0}, year = {2005}, issn = {1081-7735}, pages = {450}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.67}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - IEEE Std 1500 Compliant Infrastructure forModular SOC Testing SN - 1081-7735 SP EP A1 - Tom Waayers, A1 - Erik Jan Marinissen, A1 - Maurice Lousberg, PY - 2005 KW - null VL - 0 JA - Asian Test Symposium ER -

Tom Waayers, Philips Research Laboratories, The Netherlands

Erik Jan Marinissen, Philips Research Laboratories, The Netherlands

Maurice Lousberg, Philips Research Laboratories, The Netherlands

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2005.67

Modern semiconductor process technologies enable the manufacturing of a complete system on one single die, the so-called system-on-chip or SOC. Building those chips in a timely and cost-effective manner is amongst others realized by embedding third-party IP cores. Due to imperfections in silicon manufacturing, an SOC including all its embedded modules needs to be tested for manufacturing defects.

Citation:

Tom Waayers, Erik Jan Marinissen, Maurice Lousberg, "IEEE Std 1500 Compliant Infrastructure forModular SOC Testing," ats, pp.450, 14th Asian Test Symposium (ATS'05), 2005

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.