The Advent of Nanotechnology imposes challenges on current based testing which existing ATE embedded solutions do not properly address. Luckily alternative solutions are available that not only overcome the challenges but meanwhile also help to improve screening efficiency, reduce test efforts, time and cost without compromising on test and product quality and even are offering ways to improve the latter. The contribution will consider this as well as the application requirements of such advanced add-on IDDQ measurement solutions and illustrates their application and achievable benefits on base of a number of real-life case studies. At the end conclusions will be drawn and guidelines for the future will be presented.