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14th Asian Test Symposium (ATS'05)
CryptoScan: A Secured Scan Chain Architecture
Calcutta, India
December 18-December 21
ISBN: 0-7695-2481-8
ASCII Text
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D. Mukhopadhyay, S. Banerjee, D. RoyChowdhury, B. B. Bhattacharya, "CryptoScan: A Secured Scan Chain Architecture," Asian Test Symposium, pp. 348-353, 14th Asian Test Symposium (ATS'05), 2005.
 
 
BibTex
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@article{ 10.1109/ATS.2005.42,
author = {D. Mukhopadhyay and S. Banerjee and D. RoyChowdhury and B. B. Bhattacharya},
title = {CryptoScan: A Secured Scan Chain Architecture},
journal ={Asian Test Symposium},
volume = {0},
year = {2005},
issn = {1081-7735},
pages = {348-353},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.42},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - CryptoScan: A Secured Scan Chain Architecture
SN - 1081-7735
SP348
EP353
A1 - D. Mukhopadhyay,
A1 - S. Banerjee,
A1 - D. RoyChowdhury,
A1 - B. B. Bhattacharya,
PY - 2005
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
D. Mukhopadhyay, Indian Institute of Technology Kharagpur, India
S. Banerjee, Indian Institute of Technology Kharagpur, India
D. RoyChowdhury, Indian Institute of Technology Kharagpur, India
B. B. Bhattacharya, Indian Institute of Technology Kharagpur, India
Scan based testing is a powerful and popular test technique. However the scan chain can be used by an attacker to decipher the cryptogram. The present paper shows such a side-channel attack on LFSR-based stream ciphers using scan chains. The paper subsequently discusses a strategy to build the scan chains in a tree based pattern with a selfchecking compactor. It has been shown that such a structure prevents such scan based attacks but does not compromise on fault coverage.
Citation:
D. Mukhopadhyay, S. Banerjee, D. RoyChowdhury, B. B. Bhattacharya, "CryptoScan: A Secured Scan Chain Architecture," ats, pp.348-353, 14th Asian Test Symposium (ATS'05), 2005
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