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14th Asian Test Symposium (ATS'05)
CryptoScan: A Secured Scan Chain Architecture
Calcutta, India
December 18-December 21
ISBN: 0-7695-2481-8
D. Mukhopadhyay, Indian Institute of Technology Kharagpur, India
S. Banerjee, Indian Institute of Technology Kharagpur, India
D. RoyChowdhury, Indian Institute of Technology Kharagpur, India
B. B. Bhattacharya, Indian Institute of Technology Kharagpur, India
Scan based testing is a powerful and popular test technique. However the scan chain can be used by an attacker to decipher the cryptogram. The present paper shows such a side-channel attack on LFSR-based stream ciphers using scan chains. The paper subsequently discusses a strategy to build the scan chains in a tree based pattern with a selfchecking compactor. It has been shown that such a structure prevents such scan based attacks but does not compromise on fault coverage.
Citation:
D. Mukhopadhyay, S. Banerjee, D. RoyChowdhury, B. B. Bhattacharya, "CryptoScan: A Secured Scan Chain Architecture," ats, pp.348-353, 14th Asian Test Symposium (ATS'05), 2005
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