An Effective Design for Hierarchical Test Generation Based on Strong Testability

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14th Asian Test Symposium (ATS'05)

Calcutta, India

December 18-December 21

ISBN: 0-7695-2481-8

	ASCII Text	x
	Hideyuki Ichihara, Tomoo Inoue, Naoki Okamoto, Toshinori Hosokawa, Hideo Fujiwara, "An Effective Design for Hierarchical Test Generation Based on Strong Testability," Asian Test Symposium, pp. 288-293, 14th Asian Test Symposium (ATS'05), 2005.

	BibTex	x
	@article{ 10.1109/ATS.2005.23, author = {Hideyuki Ichihara and Tomoo Inoue and Naoki Okamoto and Toshinori Hosokawa and Hideo Fujiwara}, title = {An Effective Design for Hierarchical Test Generation Based on Strong Testability}, journal ={Asian Test Symposium}, volume = {0}, year = {2005}, issn = {1081-7735}, pages = {288-293}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.23}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - An Effective Design for Hierarchical Test Generation Based on Strong Testability SN - 1081-7735 SP288 EP293 A1 - Hideyuki Ichihara, A1 - Tomoo Inoue, A1 - Naoki Okamoto, A1 - Toshinori Hosokawa, A1 - Hideo Fujiwara, PY - 2005 KW - Hierarchical test generation KW - strong testability KW - datapath KW - test plan. VL - 0 JA - Asian Test Symposium ER -

Hideyuki Ichihara, Faculty of Information Sciences Hiroshima City University

Tomoo Inoue, Faculty of Information Sciences Hiroshima City University

Naoki Okamoto, Graduate School of Information Sciences Hiroshima City University

Toshinori Hosokawa, College of Industrial Technology Nihon University

Hideo Fujiwara, Nara Institute of Science and Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2005.23

Hierarchical test generation is an efficient method of test generation for VLSI circuits. In this paper, we study a test plan generation algorithm for hierarchical test based on strong testability. We propose a heuristic algorithm for finding a control forest requiring a small number of hold functions by improving an existing test plan generation algorithm based on strong testability. Experimental results show that the proposed algorithm is effective in reducing additional hold functions, i.e., reducing hardware overhead and delay penalty of datapaths.

Index Terms:

Hierarchical test generation, strong testability,datapath, test plan.

Citation:

Hideyuki Ichihara, Tomoo Inoue, Naoki Okamoto, Toshinori Hosokawa, Hideo Fujiwara, "An Effective Design for Hierarchical Test Generation Based on Strong Testability," ats, pp.288-293, 14th Asian Test Symposium (ATS'05), 2005

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