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14th Asian Test Symposium (ATS'05)
Calcutta, India
December 18-December 21
ISBN: 0-7695-2481-8
ASCII Text
x 
 
Prabhu Krishnamurthy, "The Ultimate Chase," Asian Test Symposium, pp. 454, 14th Asian Test Symposium (ATS'05), 2005.
 
 
BibTex
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@article{ 10.1109/ATS.2005.107,
author = {Prabhu Krishnamurthy},
title = {The Ultimate Chase},
journal ={Asian Test Symposium},
volume = {0},
year = {2005},
issn = {1081-7735},
pages = {454},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.107},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Asian Test Symposium
TI - The Ultimate Chase
SN - 1081-7735
SP
EP
A1 - Prabhu Krishnamurthy,
PY - 2005
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
Prabhu Krishnamurthy, LSI Logic Corp.
Defects - they come in various shapes and sizes; they make the difference between good and bad; they make us sweat and swear. Catching them all has remained a challenge and will continue to be, for years to come.
Citation:
Prabhu Krishnamurthy, "The Ultimate Chase," ats, pp.454, 14th Asian Test Symposium (ATS'05), 2005
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