14th Asian Test Symposium (ATS'05) Test Data Compression with Partial LFSR-Reseeding Calcutta, India December 18-December 21 ISBN: 0-7695-2481-8
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2005.105
The large amount of test data becomes a serious problem in SOC testing. In this paper, we propose a method to improve the LFSR reseeding based compression scheme. This method rearranges a given set of test data by merging and partitioning test cubes so that they can be decompressed with a fixed-length LFSR. The compression is done by eliminating repeated patterns in consecutive seeds. A singlepolynomial LFSR is used, so that the decompression process is simple and fast. Besides, it does not need an on-chip decoder. The compression method is very efficient, as experimental results show that it reduces 23.6% of stored data and 34.8% of transferred data compared with the previous methods.
Citation:
Yu-Hsuan Fu, Sying-Jyan Wang, "Test Data Compression with Partial LFSR-Reseeding," ats, pp.343-347, 14th Asian Test Symposium (ATS'05), 2005 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||