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14th Asian Test Symposium (ATS'05)
Synthesis of Testable Finite State Machine Through Decomposition
Calcutta, India
December 18-December 21
ISBN: 0-7695-2481-8
Biplab K Sikdar, Bengal Eng. and Science Univ., Shibpur, India
Arijit Sarkar, Bengal Eng. and Science Univ., Shibpur, India
S Roy, National Institute of Teachers' Training and Research, India
DeBesh K Das, Jadavpur University, India
This paper reports an efficient state encoding scheme for synthesis of large FSMs with enhanced BIST quality. A metric, referred to as degree-of-freedom (DOF) [5] in FSM states has been employed to quantify the BIST quality. Analysis of DOF enables efficient encoding of FSM states and gives solution to the problem of handling unreachable/ hard-to-exit/ hardto- reach state codes of an FSM. The synthesis of a large FSM is realized through decomposition. DOF analysis for the individual component sub-FSM states is done to reduce the complexity of synthesis. A scheme is proposed for encoding the sub-FSM states that significantly improves testability of the synthesized resultant FSM, displaying the terminal behavior as the original FSM.
Index Terms:
degree-of-freedom, reachability, emitability,FSM state encoding, decomposition.
Citation:
Biplab K Sikdar, Arijit Sarkar, S Roy, DeBesh K Das, "Synthesis of Testable Finite State Machine Through Decomposition," ats, pp.398-403, 14th Asian Test Symposium (ATS'05), 2005
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