Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction

A
ATS
2004
13th Asian Test Symposium (ATS'04)
Abstract - Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Yoshinobu Higami Articles by Seiji Kajihara Articles by Sin-ya Kobayashi Articles by Yuzo Takamatsu

13th Asian Test Symposium (ATS'04)

Kenting, Taiwan

November 15-November 17

ISBN: 0-7695-2235-1

	ASCII Text	x
	Yoshinobu Higami, Seiji Kajihara, Sin-ya Kobayashi, Yuzo Takamatsu, "Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction," Asian Test Symposium, pp. 46-49, 13th Asian Test Symposium (ATS'04), 2004.

	BibTex	x
	@article{ 10.1109/ATS.2004.80, author = {Yoshinobu Higami and Seiji Kajihara and Sin-ya Kobayashi and Yuzo Takamatsu}, title = {Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction}, journal ={Asian Test Symposium}, volume = {0}, year = {2004}, issn = {1081-7735}, pages = {46-49}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.80}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction SN - 1081-7735 SP46 EP49 A1 - Yoshinobu Higami, A1 - Seiji Kajihara, A1 - Sin-ya Kobayashi, A1 - Yuzo Takamatsu, PY - 2004 KW - null VL - 0 JA - Asian Test Symposium ER -

Yoshinobu Higami, Ehime University

Seiji Kajihara, Kyusyu Institute of Technology

Sin-ya Kobayashi, Ehime University

Yuzo Takamatsu, Ehime University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2004.80

In this paper, we propose new techniques for finding Xs in test sequences for sequential circuits. Also we show two applications that utilize the obtained test sequences with Xs: reduction of the power during test and test compaction.

Citation:

Yoshinobu Higami, Seiji Kajihara, Sin-ya Kobayashi, Yuzo Takamatsu, "Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction," ats, pp.46-49, 13th Asian Test Symposium (ATS'04), 2004

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.