This paper describes a heuristic for system-on-chip test scheduling in an abort-on-fail context, where the test is terminated as soon as a defect is detected. We consider an hybrid BIST architecture, where a test set is assembled from pseudorandom and deterministic test patterns. We take into account defect probabilities of individual cores in order to schedule the tests so that the expected total test time in the abort-on fail environment is minimized. Different from previous approaches, our hybrid BIST based approach enables us not only to schedule the tests but also to modify the internal test composition, the order and ratio of pseudo-random and deterministic test patterns, in order to reduce the expected total test time. Experimental results have shown the efficiency of the proposed heuristic to find good quality solutions with low computational overhead.