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13th Asian Test Symposium (ATS'04)
Design and Implementation of Self-Testable Full Range Window Comparator
Kenting, Taiwan
November 15-November 17
ISBN: 0-7695-2235-1
ASCII Text
x 
 
Mike W. T. Wong, Yubin Zhang, "Design and Implementation of Self-Testable Full Range Window Comparator," Asian Test Symposium, pp. 314-318, 13th Asian Test Symposium (ATS'04), 2004.
 
 
BibTex
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@article{ 10.1109/ATS.2004.35,
author = {Mike W. T. Wong and Yubin Zhang},
title = {Design and Implementation of Self-Testable Full Range Window Comparator},
journal ={Asian Test Symposium},
volume = {0},
year = {2004},
issn = {1081-7735},
pages = {314-318},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.35},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Design and Implementation of Self-Testable Full Range Window Comparator
SN - 1081-7735
SP314
EP318
A1 - Mike W. T. Wong,
A1 - Yubin Zhang,
PY - 2004
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
Mike W. T. Wong, Hong Kong Polytechnic University
Yubin Zhang, Hong Kong Polytechnic University
This paper presents a new approach to implement a full range window comparator (FRWC) with self-testing capability. Detailed analysis of the proposed comparator circuit has shown that the overall design not only can achieve high fault coverage in the FRWC but also can detect or tolerate single fault in the self testing circuitry used.
Citation:
Mike W. T. Wong, Yubin Zhang, "Design and Implementation of Self-Testable Full Range Window Comparator," ats, pp.314-318, 13th Asian Test Symposium (ATS'04), 2004
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